Near-field scanning optical microscopy of photonic crystal nanocavities
نویسندگان
چکیده
منابع مشابه
Near-field scanning optical microscopy of photonic crystal nanocavities
Near-field scanning optical microscopy was used to observe high-resolution images of confined modes and photonic bands of planar photonic crystal ~PPC! nanocavities fabricated in active InGaAsP material. We have observed the smallest optical cavity modes, which are intentionally produced by fractional edge dislocation high-Q cavity designs. The size of the detected mode was roughly four by thre...
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Near-field scanning optical microscopy (NSOM) is a powerful alternative method to observe the optical intensity distributions in fabricated nanophotonic structures. Several groups have obtained NSOM images of photonic crystal (PC) [1-2]. Quite recently, we have reported the optical mode images obtained by NSOM on compact PC cavities based on fractional edge dislocations [3]. Here we report high...
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Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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We have measured the photonic bandstructure of GaAs photonic-crystal waveguides with high resolution in energy as well as in momentum using near-field scanning optical microscopy. Intriguingly, we observe additional bands that are not predicted by eigenmode solvers, as was recently demonstrated by Huisman et al. [Phys. Rev. B 86, 155154 (2012)]. We study the presence of these additional bands b...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2003
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.1559646